1 a os semiconductor produc t reliabilit y repor t AOZ8006FI, rev 1 plastic encapsulated device alph a & omeg a semiconducto r , inc 495 mercury drive sunnyvale, ca 94085 u.s. tel: ( 408 ) 830-9742 www.aosmd.com jun 25, 2007
2 this aos product reliability report summarizes the qualification result for AOZ8006FI. review of the electrical test results confirm that AOZ8006FI pass aos quality and reliability requirements for product release. the continuous qualification te sting and reliability monitoring program ensure that all outgoing pr oducts will continue to meet ao s quality and reliability standards. table of contents: i. product description ii. package and die information iii. qualification test requirements iv. qualification tests result v. quality assurance information i. product description: the AOZ8006FI is a transient voltage suppressor array designed to protect high speed data lines from esd and lightning. the product comes in rohs compliant, msop10 package and is rated over a -40c to +85c ambient temperature range. . absolute maximum ratings parameter vp-vn 6v peak pulse current (ipp), tp=8/20us 5a storage temperature (t s ) -65c to +150c esd rating per iec61000-4-2, contact (1) 8kv esd rating per iec61000-4-2, air (2) 15kv esd rating per human body model (2) 8kv junction temperature (t j ) -40c to +125c notes: (1) iec-61000-4-2 discharge with c discharge =150pf, r discharge =330 ? (2) human body discharge per mil-std-883, method 3015 c discharge =100pf, r discharge =1.5k ? ii. package and die information: product id AOZ8006FI process umc 0.5um 5/18v 2p3m process package type msop10 die ui001a1_epi (size: 716 x 616 um) l/f material asm a194fh die attach material ablestik 8360 epoxy die bond wire au , 1mil mold material sumitomo eme-6600d plating material matte tin
3 iii. qualification tests requirments ? same package as aoz8007fi, therefore, the part will be qual. by extension. ? same package as aoz8005fi, only difference is the di e has bm (back metal) and die attach material is conductive epoxy. therefore, aoz8005fi test data can be used for qual. also. iv. qualification tests result test item test condition sample size result comment pre- conditioning (qual by extension, using aoz8007fi data ) per jesd 22-a113 85 c 0 /85%rh, 3 cyc reflow@260 0 c 3 lots (82 /lot) pass lots 1 (wafer lot# fn646.52- 6 , marking: b1002), 82 units, passed pre-con. lots 2 (wafer lot# fn646.52-6, marking: b1003), 82 units, passed pre-con. lots 3 (wafer lot# fn646.52-6, marking: b1004), 82 units, passed pre-conditioning. htol (pkg qual burn-in, using aoz8005fi data ) per jesd 22-a108_b vdd=6v temp = 125 0 c 3 lots (80 /lot) pass lots 1 ( wafer lot# f9an1.51-01 , m a rking: z96r11a ), 80 units, passed 500 hrs . lots 2 (wafer lot# f9an1.51-01 , marking: z96r11b ), 80 units, passed 500 hrs . lots 3 (wafer lot# f9an1.51-01 , marking: b1001 ), 82 units, passed 500 hrs . htol (die qual burn-in, using aoz8005ci data ) per jesd 22-a108_b vdd=6v temp = 125 0 c 2 lots (80 /lot) pass ic qual by extension using aoz8005ci which uses the same die. lots 1 (wafer lot# fn2mt.01-12, marking: ac001), 80 units, passed 500 hrs . lots 2 (wafer lot# fn646.03-4 marking: ac003), 80 units, passed 168 hrs . hast ( qual by extension, using aoz8005fi data ) '130 +/- 2 0 c, 85%rh, 33.3 psi, at vcc min power dissapation 3 lots (60 /lot) pass lots 1 (wafer lot# f9an1.51-01 , marking: z96r11a), 60 units, passed hast 100 hr . lots 2 (wafer lot# f9an1.51-01 , marking: z96r11b), 60 units, passed hast 100 h . lots 3 (wafer lot# f162t , marking: b1001), 60 units, passed hast 100 h rs. temperature cycle ( qual by extension, using aoz8007fi data ) '-65 0 c to +150 0 c, air to air (2cyc/hr) 3 lots (82 /lot) pass lots 1 ( wafer lot# fn646.52- 6 , marking: b1002), 82 units, passed tc 500 cycles. lots 2 (wafer lot# fn646.52-6 , marking: b1003), 82 units, passed tc 500 cycles. lots 3 (wafer lot# fn646.52-6 , marking: b1004), 82 units, passed tc 500 cycles. pressure pot ( qual by extension, using aoz8007fi data ) 121c, 15+/-1 psig, rh= 100% 3 lots (82 /lot) pass lots 1 ( wafer lot# fn646.52- 6 , marking: b1002), 82 units, passed pct 96 hrs. lots 2 (wafer lot# fn646.52-6 , marking: b1003), 82 units, passed pct 96 hrs. lots 3 (wafer lot# fn646.52-6 , marking: b1004 ), 82 units, passed pct 96 hrs. esd rating per iec-61000-4-2, contact 3 units pass lot 1 ( wafer lot# fn646.52-6 , marking: b1001 ), 3 units passed 8kv esd rating per iec-61000-4-2, air 3 units pass lot 1 ( wafer lot# fn646.52-6 , marking: b1001 ), 3 units passed 15kv latch-up ( aoz8005ci data ) per jesd78a 3 units pass lot 1 (wafer lot# fn646.03-4 , marking: ac003 ), 3 units passed latch-up. the qualification test results confirm that AOZ8006FI pass aos quality and reliability requirements for product release.
4 v. quality assurance information acceptable quality level for outgoing inspection: 0.1% for electrical and visual. guaranteed outgoing defect rate: < 50 ppm quality sample plan: conform to mil-std -105d
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